Search results for: Lixi Wan
Journal of Electronic Testing > 2017 > 33 > 6 > 741-750
Microelectronics Reliability > 2017 > 79 > C > 38-47
Microelectronics Reliability > 2016 > 65 > C > 98-107
Microsystem Technologies > 2017 > 23 > 10 > 4579-4589
Microsystem Technologies > 2016 > 22 > 2 > 337-347
Thin Solid Films > 2014 > 550 > Complete > 259-263