Search results for: Clement Tavernier
Microelectronics Reliability > 2016 > 63 > C > 90-96
Acta Materialia > 2016 > 106 > C > 290-294
Materials Science in Semiconductor Processing > 2016 > 42 > Part 2 > 247-250
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 8 > 1085 - 1092
Microelectronics Reliability > 2015 > 55 > 6 > 980-989
Microelectronics Reliability > 2014 > 54 > 4 > 764-772
physica status solidi c > 11 > 1 > 7 - 8
physica status solidi c > 11 > 1 > 97 - 100
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 8 > 1284 - 1292
Solid State Electronics > 2013 > 88 > Complete > 9-14
Microelectronics Reliability > 2013 > 53 > 2 > 229-235
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 983 - 993
physica status solidi (a) > 208 > 3 > 608 - 611
Solid State Electronics > 2010 > 54 > 12 > 1669-1674