Search results for: Philippe Galy
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4904 - 4909
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4486 - 4491
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
Microelectronics Reliability > 2017 > 76-77 > C > 680-684
Microelectronic Engineering > 2017 > 180 > C > 1-4
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 916 - 922
Solid-State Electronics > 2017 > 128 > C > 172-179
Solid-State Electronics > 2016 > 115 > PB > 192-200
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 11 > 3747 - 3759
Microelectronics Reliability > 2015 > 55 > 9-10 > 1532-1536
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 1900 - 1906