Search results for: B. Foucher
Microelectronics Reliability > 2014 > 54 > 9-10 > 1718-1723
La Revue de medecine interne > 2012 > 33 > 6 > 343-345
Microelectronics Reliability > 2009 > 49 > 9-11 > 1381-1385
Microelectronics Reliability > 2007 > 47 > 12 > 1857-1864
Microelectronics Reliability > 2006 > 46 > 5-6 > 1013-1018
Journal of Electrostatics > 2002 > 56 > 3 > 281-294
Microelectronics Reliability > 2002 > 42 > 8 > 1155-1162
Microelectronics Reliability > 2000 > 40 > 8-10 > 1473-1477