Search results for: P. Galy
Microelectronics Reliability > 2016 > 64 > C > 101-108
Microelectronics Reliability > 2011 > 51 > 9-11 > 1614-1617
EOS/ESD Symposium Proceedings > 1 - 6
Microelectronics Reliability > 2010 > 50 > 9-11 > 1379-1382
2009 31st EOS/ESD Symposium > 1 - 8
Nuclear Physics B (Proceedings Supplements) > 2006 > 158 > Complete > 199-203
Journal of Electrostatics > 2002 > 56 > 3 > 281-294