Search results for: J. Wuerfl
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.1.1 - 3C.1.7
Microelectronics Reliability > 2012 > 52 > 9-10 > 2426-2430
Microelectronics Reliability > 2011 > 51 > 9-11 > 1710-1716
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 1897 - 1903
IEEE Transactions on Microwave Theory and Techniques > 2009 > 57 > 9 > 2114 - 2121
IEE Proceedings I Communications, Speech and Vision [see also IEE Proceedings-Communications] > 1988 > 135 > 2 > 25 - 28