Search results for: N. Mauran
Microelectronics Reliability > 2015 > 55 > 11 > 2276-2283
Microelectronics Reliability > 2013 > 53 > 9-11 > 1278-1283
2009 31st EOS/ESD Symposium > 1 - 8
IEEE Electron Device Letters > 2009 > 30 > 6 > 687 - 689
Microelectronics Reliability > 2008 > 48 > 8-9 > 1237-1240
Journal of Microelectromechanical Systems > 2008 > 17 > 4 > 832 - 836