Search results for: R.P. Ribas
Microelectronics Reliability > 2013 > 53 > 9-11 > 1360-1364
Microelectronics Reliability > 2012 > 52 > 9-10 > 1822-1826
Microelectronics Journal > 2011 > 42 > 2 > 371-381
Microelectronics Journal > 1998 > 29 > 9 > 613-619