Search results for: G. Ghidini
Thin Solid Films > 2017 > 636 > C > 78-84
Surface and Interface Analysis > 45 > 1 > 398 - 401
Microelectronics Reliability > 2012 > 52 > 9-10 > 1876-1882
Microelectronic Engineering > 2011 > 88 > 7 > 1182-1185
Microelectronic Engineering > 2010 > 87 > 3 > 290-293
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 637 - 643
Microelectronic Engineering > 2009 > 86 > 10 > 2123-2126
Microelectronics Reliability > 2009 > 49 > 9-11 > 1188-1191
Microelectronic Engineering > 2009 > 86 > 7-9 > 1822-1825
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 529 - 536
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2218 - 2224
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1964 - 1970
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2155 - 2159
IEEE Electron Device Letters > 2009 > 30 > 6 > 653 - 655
Microelectronic Engineering > 2007 > 84 > 9-10 > 1998-2001