Search results for: Y. Danto
Microelectronics Reliability > 2007 > 47 > 9-11 > 1663-1667
Microelectronics Reliability > 2006 > 46 > 9-11 > 1886-1891
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 228 - 234
Microelectronics Reliability > 2005 > 45 > 9-11 > 1593-1599
Microelectronics Reliability > 2005 > 45 > 9-11 > 1658-1661
Measurement > 2003 > 34 > 2 > 157-178
Microelectronics Reliability > 2003 > 43 > 7 > 1137-1144
Microelectronics Reliability > 2003 > 43 > 7 > 1125-1136
Microelectronics Reliability > 2003 > 43 > 1 > 173-177