Search results for: J.D. Cressler
IEEE Transactions on Electron Devices > 2009 > 56 > 10 > 2169 - 2177
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 479 - 487
IEEE Transactions on Electron Devices > 2009 > 56 > 10 > 2169 - 2177
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 479 - 487