Search results for: Claudio Lanzieri
IEEE Electron Device Letters > 2015 > 36 > 10 > 1011 - 1014
2014 IEEE International Reliability Physics Symposium > 6C.6.1 - 6C.6.7
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4070 - 4077
Applied Surface Science > 2013 > 272 > Complete > 128-131
IEEE Transactions on Nuclear Science > 2013 > 60 > 2-2 > 1436 - 1441
Journal of Infrared, Millimeter, and Terahertz Waves > 2009 > 30 > 12 > 1362-1373
Microelectronics Reliability > 2008 > 48 > 8-9 > 1361-1365
IEEE Transactions on Electron Devices > 2007 > 54 > 4 > 879 - 882
Nuclear Inst. and Methods in Physics Research, A > 2004 > 522 > 3 > 413-419
Nuclear Inst. and Methods in Physics Research, A > 2004 > 518 > 1-2 > 433-435