Search results for: J. Borremans
2010 Proceedings of ESSCIRC > 402 - 405
IEEE Journal of Solid-State Circuits > 2010 > 45 > 10 > 2116 - 2129
IEEE Journal of Solid-State Circuits > 2010 > 45 > 12 > 2794 - 2806
Microelectronics Reliability > 2009 > 49 > 12 > 1440-1446
IEEE Journal of Solid-State Circuits > 2009 > 44 > 11 > 2873 - 2880