Search results for: D.Q. Kelly
IEEE Electron Device Letters > 2009 > 30 > 2 > 136 - 138
Electronics Letters > 2008 > 44 > 3 > 240 - 241
Microelectronic Engineering > 2007 > 84 > 9-10 > 2054-2057
Microelectronics Reliability > 2005 > 45 > 7-8 > 1033-1040