Search results for: C. Laviron
2014 IEEE International Electron Devices Meeting > 35.4.1 - 35.4.4
Solid State Electronics > 2010 > 54 > 9 > 849-854
Solid State Electronics > 2009 > 53 > 7 > 735-740
Solid State Electronics > 2009 > 53 > 7 > 730-734
Microelectronics Reliability > 2009 > 49 > 2 > 209-214