Search results for: P. Coudrain
International Journal of Solids and Structures > 2017 > 117 > C > 208-220
2015 IEEE International Electron Devices Meeting (IEDM) > 8.5.1 - 8.5.4
2014 IEEE International Electron Devices Meeting > 35.4.1 - 35.4.4
2014 IEEE International Reliability Physics Symposium > 3E.2.1 - 3E.2.6