Wyniki wyszukiwania dla: Da-Yuan Shih
Microelectronics Reliability > 2009 > 49 > 3 > 288-295
Journal of Electronic Materials > 2009 > 38 > 11 > 2242-2250
Journal of Electronic Materials > 2009 > 38 > 12 > 2461-2469
Journal of Electronic Materials > 2009 > 38 > 2 > 257-265
Journal of Electronic Materials > 2007 > 36 > 11 > 1501-1509
Journal of Electronic Materials > 2005 > 34 > 5 > 635-642