Search results for: C. Gaumer
2015 IEEE International Electron Devices Meeting (IEDM) > 8.6.1 - 8.6.4
2013 IEEE International Reliability Physics Symposium (IRPS) > GD.1.1 - GD.1.4
Thin Solid Films > 2012 > 525 > Complete > 20-27
Applied Surface Science > 2012 > 258 > 6 > 2107-2112
Microelectronic Engineering > 2011 > 88 > 1 > 72-75
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1809 - 1819