Search results for: J. Widiez
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4503 - 4509
Microelectronics Reliability > 2012 > 52 > 11 > 2602-2608
Microelectronic Engineering > 2011 > 88 > 7 > 1265-1268
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4503 - 4509
Microelectronics Reliability > 2012 > 52 > 11 > 2602-2608
Microelectronic Engineering > 2011 > 88 > 7 > 1265-1268