Search results for: Xiao Gong
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4317 - 4321
2013 IEEE International Electron Devices Meeting > 16.5.1 - 16.5.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 524 - 533
IEEE Electron Device Letters > 2011 > 32 > 2 > 146 - 148
IEEE Transactions on Electron Devices > 2010 > 57 > 5 > 973 - 979
IEEE Electron Device Letters > 2009 > 30 > 8 > 805 - 807