Search results for: Hyungcheol Shin
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 758 - 762
Solid-State Electronics > 2017 > 137 > C > 123-127
Solid-State Electronics > 2017 > 136 > C > 81-85
Solid-State Electronics > 2017 > 136 > C > 68-74
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 659 - 667
Solid State Electronics > 2015 > 109 > Complete > 42-46
Current Applied Physics > 2014 > 14 > 8 > 1057-1062