Search results for: Xiao Yu
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
IEEE Electron Device Letters > 2017 > 38 > 4 > 434 - 437
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 909 - 915
IEEE Journal of Selected Topics in Applied Earth Observations and Remote... > 2014 > 7 > 9 > 3695 - 3703
2012 IEEE Sensors > 1 - 4