Search results for: Tomoyoshi Mishima
IEEJ Transactions on Electrical and Electronic Engineering > 17 > 9 > 1375 - 1376
physica status solidi (b) > 259 > 2 > n/a - n/a
physica status solidi (b) > 257 > 4 > n/a - n/a
physica status solidi (a) > 215 > 9 > n/a - n/a
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 4 > 486 - 493
Materials Science in Semiconductor Processing > 2017 > 70 > C > 86-91
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2017 > 409 > C > 65-68
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2017 > 409 > C > 50-52
IEEE Electron Device Letters > 2016 > 37 > 2 > 161 - 164
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2015 > 365 > PA > 168-170
IEEE Electron Device Letters > 2015 > 36 > 11 > 1180 - 1182
Thin Solid Films > 2014 > 557 > C > 258-261
Thin Solid Films > 2014 > 557 > C > 268-271
physica status solidi c > 11 > 3‐4 > 918 - 923
Sensors & Actuators: A. Physical > 2012 > 179 > Complete > 132-136
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1091 - 1098
Sensors & Actuators: A. Physical > 2011 > 171 > 2 > 223-227