Search results for: Changhua Tan
IEEE Electron Device Letters > 2009 > 30 > 4 > 410 - 412
Solid State Communications > 2006 > 139 > 1 > 23-26
Microelectronics Reliability > 2006 > 46 > 1 > 164-168
Solid State Electronics > 2005 > 49 > 1 > 57-61
Solid State Electronics > 2004 > 48 > 12 > 2335-2338
Solid State Communications > 2003 > 128 > 6-7 > 279-282
Solid State Electronics > 2003 > 47 > 9 > 1451-1456
Microelectronics Reliability > 2002 > 42 > 6 > 985-989
Microelectronics Reliability > 2002 > 42 > 2 > 175-181
Solid State Electronics > 2002 > 46 > 1 > 115-121
Microelectronics Reliability > 2001 > 41 > 11 > 1909-1913
Solid State Communications > 2001 > 119 > 2 > 67-71