Search results for: J. L. Rouvière
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Wide Band-Gap Nitrides > 3-12
2014 IEEE International Electron Devices Meeting > 20.5.1 - 20.5.4
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Wide Band-Gap Nitrides > 3-12
2014 IEEE International Electron Devices Meeting > 20.5.1 - 20.5.4