Search results for: W. Huang
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 101 - 104
IEEE Electron Device Letters > 2011 > 32 > 6 > 734 - 736
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4
Electronics Letters > 2008 > 44 > 9 > 562