Search results for: Roberto S. Murphy‐Arteaga
International Journal of RF and Microwave Computer‐Aided Engineering > 31 > 10 > n/a - n/a
Microwave and Optical Technology Letters > 62 > 2 > 606 - 614
Microelectronics Reliability > 2017 > 69 > C > 1-16
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3844 - 3850
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1821 - 1826
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 1 > 125 - 132
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 12-2 > 4255 - 4262
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 12-1 > 3888 - 3895
IEEE Transactions on Microwave Theory and Techniques > 2014 > 62 > 12-2 > 3255 - 3261
International Journal of RF and Microwave Computer‐Aided Engineering > 23 > 6 > 655 - 661
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2450 - 2456
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1803 - 1806