Search results for: H. Chen
2016 IEEE International Electron Devices Meeting (IEDM) > 27.4.1 - 27.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 14.4.1 - 14.4.4
2015 IEEE International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
EOS/ESD Symposium Proceedings > 1 - 8
2010 International Electron Devices Meeting > 35.5.1 - 35.5.4