Search results for: A.V. Vairagar
Journal of Electronic Materials > 2012 > 41 > 3 > 568-572
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 1 > 20 - 30
Microelectronics Reliability > 2006 > 46 > 8 > 1392-1395
Thin Solid Films > 2006 > 504 > 1-2 > 279-283
Microelectronic Engineering > 2005 > 82 > 3-4 > 675-679
Surface & Coatings Technology > 2005 > 198 > 1-3 > 257-261
Thin Solid Films > 2004 > 462-463 > Complete > 325-329
Microelectronics Reliability > 2004 > 44 > 5 > 747-754