Search results for: Ken Takeuchi
Proceedings of the IEEE > 2017 > 105 > 9 > 1812 - 1821
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-4.1 - 5A-4.6
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-6.1 - PM-6.4
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-13.1 - PM-13.4
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-12.1 - PM-12.5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 510 - 519
IEEE Journal of Solid-State Circuits > 2016 > 51 > 10 > 2389 - 2397