Search results for: Fei Lu
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 10 > 1746 - 1757
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3205 - 3212
IEEE Electron Device Letters > 2016 > 37 > 5 > 674 - 676
2016 IEEE International Reliability Physics Symposium (IRPS) > 3B-6-1 - 3B-6-5
IEEE Journal of Solid-State Circuits > 2014 > 49 > 9 > 1927 - 1941
IEEE Electron Device Letters > 2014 > 35 > 3 > 381 - 383