Search results for: Sudeep Pasricha
Journal of Parallel and Distributed Computing > 2018 > 112 > P2 > 126-139
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 168 - 181
Reliability Engineering & System Safety > 2017 > 167 > C > 177-183
IEEE Consumer Electronics Magazine > 2017 > 6 > 4 > 70 - 80
IEEE Transactions on Multi-Scale Computing Systems > 2017 > 3 > 2 > 72 - 85
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 534 - 546