Search results for: J.-Y. Deletage
Microelectronics Reliability > 2017 > 76-77 > C > 674-679
Microelectronics Reliability > 2016 > 64 > C > 242-247
Microelectronics Reliability > 2016 > 64 > C > 409-414
Microelectronics Reliability > 2013 > 53 > 9-11 > 1719-1724
2011 IEEE Energy Conversion Congress and Exposition > 3879 - 3885
Microelectronics Reliability > 2011 > 51 > 9-11 > 1968-1971
Microelectronics Reliability > 2010 > 50 > 9-11 > 1796-1803
2009 IEEE Energy Conversion Congress and Exposition > 3942 - 3947
2009 IEEE Energy Conversion Congress and Exposition > 1791 - 1798