Search results for: Emeric De Foucauld
Journal of Electronic Testing > 2015 > 31 > 4 > 381-394
Microelectronics Journal > 2011 > 42 > 1 > 233-238
Microelectronics Journal > 2008 > 39 > 9 > 1130-1139
Journal of Electronic Testing > 2015 > 31 > 4 > 381-394
Microelectronics Journal > 2011 > 42 > 1 > 233-238
Microelectronics Journal > 2008 > 39 > 9 > 1130-1139