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Reducing test costs of analog and RF circuits is a complex challenge, for which intuitive solution is to reduce test time. However, such reduction usually leads to a degradation of measurement accuracy not easy to handle when no model is available to understand the impact of the reduction. This work presents a novel method to evaluate the impact of test time reduction on yield accuracy, using only...
In this paper, we introduce a new method for improving the use of Alternative Measurements Strategy for analog circuit testing. The goal is to reduce the test cost by selecting the cheapest set of measurements that do not bring redundant information about the state of the circuit, without reducing test coverage. The proposed method consists in finding a subset of a given set of parameters which explains...
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