Search results for: Jun-ho Choy
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-5.1 - 6B-5.10
Integration, the VLSI Journal > 2016 > 55 > C > 307-315
Journal of Electronic Testing > 2012 > 28 > 1 > 63-72
Journal of Electronic Materials > 2002 > 31 > 10 > 988-993
Journal of Electronic Materials > 2001 > 30 > 12 > 1609-1615
Materials Science & Engineering A > 2000 > 285 > 1-2 > 195 - 206