Search results for: K.-D. Lang
Microelectronics Reliability > 2017 > 76-77 > C > 450-454
Microelectronics Reliability > 2016 > 66 > C > 98-105
Microelectronics Reliability > 2016 > 64 > C > 140-144
Journal of Power Sources > 2015 > 288 > C > 26-35