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A fast yet robust multi-domain ESD verification flow at transistor level has been developed for large SoC designs. All steps of the verification process from initial power domains configuration to the final debugging process are covered in this comprehensive solution that supports scalable ESD protection structures.
Design constraints describe the intent of IC designers when developing electronic circuits. Constraints from, e.g., electrical and thermal domains are transformed into corresponding physical constraints for layout design. Physical constraints can also be derived from circuit patterns or extracted layout netlists. The constraint verification is of utmost importance to guarantee the intended function...
Critical DRC spacing rules for high-voltage signals and the use of thin oxides for low-power applications leave ICs vulnerable to electrical overstress and other reliability issues, which may lead to oxide breakdown. New verification techniques provide diagnostic insight into reliability issues due to oxide breakdown, and identify opportunities for design improvements.
In this paper, we introduce an alternative novel technique to approximate step response in time domain based on rational function approximation of admittance. The proposed technique sustains multi-port networks and passive RLC output. An application for this technique, viz., package modeling is presented in this paper. We verify the proposed technique on package measurements. The proposed algorithm...
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