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Product cost and revenue trends are not consistent with the cost of Test, Inspection and Measurement (TIM) technologies. Specifically, while Moore?s Law has applied to the silicon in the product, it does not apply to the overall cost of test of the resulting higher-functionality, desirably lower-cost product. Higher performance and lower cost test equipment, while also desirable, are not enough to...
The increase in circuit densities and speeds are driving the reduction of electrical test point access for printed circuit assembly test. Boundary-scan technology (JTAG/IEEE 1149.x) will allow continued testability of printed circuit assemblies, but it requires that it is designed into semi-conductor devices. Currently not all semiconductor vendors support boundary-scan. Wider availability of complying...
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