Search results for: Donald Dorsey
Microelectronics Reliability > 2015 > 55 > 12(PB) > 2634-2639
Journal of Electronic Materials > 2014 > 43 > 2 > 341-347
Microelectronics Reliability > 2013 > 53 > 6 > 872-877
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 159 - 162
IEEE Transactions on Electron Devices > 2013 > 60 > 6 > 1898 - 1904