Search results for: Anton J. Bauer
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3399 - 3404
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3795 - 3799
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2474 - 2481
Microelectronic Engineering > 2016 > 156 > C > 19-23
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2562 - 2570
Thin Solid Films > 2014 > 553 > Complete > 114-117
physica status solidi c > 9 > 3‐4 > 968 - 971
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3470 - 3476
Microelectronics Reliability > 2011 > 51 > 8 > 1346-1350
Journal of Electronic Materials > 2011 > 40 > 9 > 1990-1997
IEEE Electron Device Letters > 2010 > 31 > 5 > 464 - 466
Microelectronics Reliability > 2005 > 45 > 5-6 > 819-822
Microelectronics Reliability > 2003 > 43 > 8 > 1253-1257