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Integrating a large number of embedded memories in System-on-Chips (SoC's) occupies up to more than 70% of the die size, thus requiring Built-In Self-Test (BIST) with the smallest possible area overhead. This paper analyzes MATS++(6N), March C-(10N), March SR(14N), and March CL(12N) test algorithms and shows that they cannot detect either Write Disturb Faults (WDFs) or Deceptive Read Destructive Faults...
This paper presents a new type of CMOS time-of-flight (TOF) range image sensor using single-layer gates on field oxide structure for photo conversion and charge transfer. This simple structure allows the realization of a dense TOF range imaging array with 1515 mum2 pixels in a standard CMOS process. Only an additional process step to create an n-type buried layer which is necessary for high-speed...
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