Search results for: Shi-Jie Wen
physica status solidi (a) > 218 > 14 > n/a - n/a
Journal of Materials Science: Materials in Electronics > 2019 > 30 > 10 > 9822-9835
Microelectronics Reliability > 2018 > 87 > C > 24-32
Microelectronics Reliability > 2018 > 80 > C > 85-90
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 457 - 463
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 113 - 118
IEEE Transactions on Nuclear Science > 2016 > 63 > 6 > 2934 - 2940
Thin Solid Films > 2016 > 620 > C > 64-69
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2792 - 2796
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-2 > 1898 - 1904
IEEE Transactions on Nuclear Science > 2015 > 62 > 2 > 520 - 526
2015 IEEE International Reliability Physics Symposium > SE.7.1 - SE.7.7
2014 IEEE International Reliability Physics Symposium > 2B.2.1 - 2B.2.5