Search results for: H.G. Kerkhoff
IEEE Design & Test of Computers > 2007 > 24 > 1 > 72 - 82
IEEE Sensors, 2005. > 4 pp.
Microelectronics Journal > 2003 > 34 > 10 > 913-917
Journal of Electronic Testing > 2002 > 18 > 2 > 203-212
Physica C: Superconductivity and its applications > 2001 > 350 > 3-4 > 261-268
Journal of Electronic Testing > 2001 > 17 > 3-4 > 225-231
Microelectronics Journal > 2000 > 31 > 11-12 > 999-1008
30th International Reliability Physics Symposium > 247 - 250
30th Annual Proceedings Reliability Physics 1992 > 247 - 250