Search results for: A. Asenov
Transport Problems > 2018 > T. 13, z. 4 > 23--36
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-5.1 - XT-5.7
Transport Problems > 2017 > T. 12, z. 3 > 147--157
Analog Circuit Design > Robust Design > 17-33
2015 IEEE International Electron Devices Meeting (IEDM) > 20.4.1 - 20.4.4