Search results for: L. Sterpone
Microelectronics Reliability > 2017 > 75 > C > 110-120
Microelectronics Reliability > 2016 > 64 > C > 230-234
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-2 > 3177 - 3185
Microelectronics Reliability > 2015 > 55 > 9-10 > 2087-2091
Microelectronics Reliability > 2014 > 54 > 11 > 2621-2628
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3123 - 3129
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3236 - 3243
Microelectronics Reliability > 2013 > 53 > 9-11 > 1311-1314