Wyniki wyszukiwania dla: P. Hazdra
Microelectronics Journal > 2004 > 35 > 3 > 249-257
Thin Solid Films > 2003 > 433 > 1-2 > 305-308
Microelectronics Reliability > 2003 > 43 > 4 > 537-544
Nuclear Inst. and Methods in Physics Research, B > 2003 > 201 > 3 > 513-519
Journal of Crystal Growth > 2003 > 248 > Complete > 328-332
Solid State Electronics > 2003 > 47 > 1 > 45-50
Nuclear Inst. and Methods in Physics Research, B > 2002 > 192 > 3 > 291-300
Materials Science & Engineering B > 2002 > 88 > 2-3 > 312 - 316
Nuclear Inst. and Methods in Physics Research, B > 2002 > 186 > 1-4 > 414-418
Microelectronics Journal > 2001 > 32 > 5-6 > 449-456
Microelectronics Reliability > 2000 > 40 > 3 > 427-433
Nuclear Inst. and Methods in Physics Research, B > 1995 > 96 > 1-2 > 104-108
Applied Physics A > 1995 > 61 > 6 > 637-641