Search results for: G. Eneman
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4587 - 4593
2013 IEEE International Electron Devices Meeting > 20.4.1 - 20.4.4
2012 International Electron Devices Meeting > 6.5.1 - 6.5.4
2012 International Electron Devices Meeting > 18.2.1 - 18.2.4
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
2010 International Electron Devices Meeting > 10.4.1 - 10.4.4
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4