Search results for: D. Schmitt-Landsiedel
Microelectronics Reliability > 2016 > 64 > C > 310-312
Solid-State Electronics > 2016 > 115 > PB > 74-80
Solid State Electronics > 2014 > 102 > Complete > 46-51
2013 IEEE International Electron Devices Meeting > 22.4.1 - 22.4.4
2013 Proceedings of the ESSCIRC (ESSCIRC) > 193 - 196
Sensors & Actuators: B. Chemical > 2013 > 182 > Complete > 58-65
2013 IEEE International Reliability Physics Symposium (IRPS) > 2A.4.1 - 2A.4.4
IEEE Transactions on Magnetics > 2013 > 49 > 7 > 4468 - 4471