Wyniki wyszukiwania dla: Huan-Chi Ma
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.13.1 - XT.13.4
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 623 - 630
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 518 - 523